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Accurate Determination of the Josephson Critical Current by Lock-In Measurements
Stockholm University, Faculty of Science, Department of Physics. Moscow Institute of Physics and Technology, Russia.
Stockholm University, Faculty of Science, Department of Physics.
Stockholm University, Faculty of Science, Department of Physics.
Stockholm University, Faculty of Science, Department of Physics. Moscow Institute of Physics and Technology, Russia.ORCID iD: 0000-0002-3131-8658
Number of Authors: 42021 (English)In: Nanomaterials, E-ISSN 2079-4991, Vol. 11, no 8, article id 2058Article in journal (Refereed) Published
Abstract [en]

Operation of Josephson electronics usually requires determination of the Josephson critical current Ic, which is affected both by fluctuations and measurement noise. Lock-in measurements allow obviation of 1/f noise, and therefore, provide a major advantage in terms of noise and accuracy with respect to conventional dc measurements. In this work we show both theoretically and experimentally that the Ic can be accurately extracted using first and third harmonic lock-in measurements of junction resistance. We derived analytical expressions and verified them experimentally on nano-scale Nb-PtNi-Nb and Nb-CuNi-Nb Josephson junctions.

Place, publisher, year, edition, pages
2021. Vol. 11, no 8, article id 2058
Keywords [en]
Josephson effect, superconductivity, quantum electronics, nano-devices
National Category
Physical Sciences
Identifiers
URN: urn:nbn:se:su:diva-197488DOI: 10.3390/nano11082058ISI: 000690211200001PubMedID: 34443889OAI: oai:DiVA.org:su-197488DiVA, id: diva2:1601304
Available from: 2021-10-07 Created: 2021-10-07 Last updated: 2022-01-07Bibliographically approved

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Hovhannisyan, Razmik A.Kapran, Olena M.Golod, TarasKrasnov, Vladimir M.

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