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Anti-Stokes resonant x-ray Raman scattering for atom specific and excited state selective dynamics
Stockholm University, Faculty of Science, Department of Physics.
Stockholm Univ, Dept Phys, AlbaNova Univ Ctr, SE-10691 Stockholm, Sweden.
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Number of Authors: 20
2016 (English)In: New Journal of Physics, ISSN 1367-2630, E-ISSN 1367-2630, Vol. 18, 103011Article in journal (Refereed) Published
Abstract [en]

Ultrafast electronic and structural dynamics of matter govern rate and selectivity of chemical reactions, as well as phase transitions and efficient switching in functional materials. Since x-rays determine electronic and structural properties with elemental, chemical, orbital and magnetic selectivity, short pulse x-ray sources have become central enablers of ultrafast science. Despite of these strengths, ultrafast x-rays have been poor at picking up excited state moieties from the unexcited ones. With time-resolved anti-Stokes resonant x-ray Raman scattering (AS-RXRS) performed at the LCLS, and ab initio theory we establish background free excited state selectivity in addition to the elemental, chemical, orbital and magnetic selectivity of x-rays. This unparalleled selectivity extracts low concentration excited state species along the pathway of photo induced ligand exchange of Fe(CO)(5) in ethanol. Conceptually a full theoretical treatment of all accessible insights to excited state dynamics with AS-RXRS with transform-limited x-ray pulses is given-which will be covered experimentally by upcoming transform-limited x-ray sources.

Place, publisher, year, edition, pages
2016. Vol. 18, 103011
Keyword [en]
ultrafast photochemistry, excited state selectivity, anti-Stokes resonant x-ray raman scattering, free electron lasers, resonant inelastic x-ray scattering
National Category
Physical Sciences
URN: urn:nbn:se:su:diva-136093DOI: 10.1088/1367-2630/18/10/103011ISI: 000386047000005OAI: diva2:1052773
Available from: 2016-12-07 Created: 2016-11-29 Last updated: 2016-12-07Bibliographically approved

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Josefsson, IdaSchreck, SimonOdelius, Michael
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