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Single event upsets: measurements and modelling of proton- and neutron-induced errors in a 28 nm SRAM-based FPGA
Stockholm University, Faculty of Science, Department of Physics.
2018 (English)Licentiate thesis, comprehensive summary (Other academic)
Abstract [en]

Single event upsets are radiation-induced errors affecting electronic devices, which can cause corruption of processed data. The electromagnetic calorimeter of the PANDA experiment — a hadron-physics experiment currently under development — will employ Xilinx Kintex-7 field-programmable gate arrays (FPGAs) in its readout electronics. During operation of the experiment, the FPGAs will be exposed to a high flux of radiation. Single-event upsets caused by protons and neutrons in the configuration memory of the FPGA have been studied through experiments and theoretical modelling. The device was irradiated with protons and neutrons of energies up to 184 MeV, and the corresponding single event upset cross sections were determined. In order to describe the energy-dependence of the cross sections, and to predict the error rates during operation of PANDA, a Monte Carlo model of energy-deposition mechanisms in silicon has been developed. The model predictions agree well with the experimental data for both protons and neutrons. Using the developed model, the mean time between failures due to neutrons during initial operation of PANDA is estimated to be 180 ± 40 hours per FPGA.

Place, publisher, year, edition, pages
Stockholm University, 2018. , p. 81
Keywords [en]
Single event upset, FPGA, radiation damage, Monte Carlo simulation, PANDA
National Category
Accelerator Physics and Instrumentation
Research subject
Physics
Identifiers
URN: urn:nbn:se:su:diva-156546OAI: oai:DiVA.org:su-156546DiVA, id: diva2:1209760
Presentation
2018-06-14, B4:1059, Roslagstullsbacken 21, Stockholm, 10:00
Opponent
Supervisors
Available from: 2019-06-11 Created: 2018-05-24 Last updated: 2019-06-11Bibliographically approved
List of papers
1. Measurements and Simulations of Single-Event Upsets in a 28-nm FPGA
Open this publication in new window or tab >>Measurements and Simulations of Single-Event Upsets in a 28-nm FPGA
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2017 (English)In: PoS - Proceedings of Science, ISSN 1824-8039, E-ISSN 1824-8039, Vol. 313Article in journal (Refereed) Published
Abstract [en]

Single-event upsets in the configuration memory of the 28-nm Xilinx Kintex-7 FPGA, used in the PANDA electromagnetic calorimeter, have been studied. Results from neutron and proton irradiations at energies up to 184 MeV are presented and compared with previous experimental results. In order to gain information about the energy-dependence of the single-event upset cross section, a GEANT4-based Monte Carlo simulation of upset mechanisms in nanometric silicon volumes has been developed. The results from this model are shown to agree with the experimental data for both neutrons and protons. Knowledge about the energy dependence of the cross section and of the particle flux at the location of the front-end modules in PANDA enables better estimates of the mean time between failures in the electromagnetic calorimeter. At PANDA, a total neutron flux of 1·102 cm−2 s−1 at the location of the front-end modules is expected at the lowest antiproton beam momentum and a luminosity of 1·1031 cm−2 s−1, leading to a predicted Mean Time Between Failures of 47 ± 10 hours per FPGA in the electromagnetic calorimeter.

National Category
Accelerator Physics and Instrumentation
Identifiers
urn:nbn:se:su:diva-156544 (URN)10.22323/1.313.0096 (DOI)
Conference
Topical Workshop on Electronics for Particle Physics, Santa Cruz, California, 11 - 14 September, 2017
Available from: 2018-05-24 Created: 2018-05-24 Last updated: 2018-05-25Bibliographically approved

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