High-precision mass measurements for fundamental applications using highly-charged ions with SMILETRAP
2007 (English)In: Journal of Physics, Conference Series, ISSN 1742-6588, Vol. 58, 109-112 p.Article in journal (Refereed) Published
The Penning trap mass spectrometer SMILETRAP takes advantage of highly-charged ions for high-accuracy mass measurements. In this paper recent mass measurements on Li and Ca ions are presented and their impact on fundamental applications discussed, especially the need for accurate mass values of hydrogen-like and lithium-like ions in the evaluation of the electron g-factor measurements in highly-charged ions is emphasized. Such experiments aim to test bound state quantum electrodynamics. Here the ionic mass is a key ingredient, which can be the limiting factor for the final precision.
Place, publisher, year, edition, pages
2007. Vol. 58, 109-112 p.
Atom and Molecular Physics and Optics
IdentifiersURN: urn:nbn:se:su:diva-11017DOI: 10.1088/1742-6596/58/1/018OAI: oai:DiVA.org:su-11017DiVA: diva2:177536