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Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy
Stockholm University, Faculty of Science, Department of Physical, Inorganic and Structural Chemistry.
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2008 (English)In: Chemical Communications, 3894-3896 p.Article in journal (Refereed) Published
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2008. 3894-3896 p.
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URN: urn:nbn:se:su:diva-15245ISI: 000258686400017OAI: oai:DiVA.org:su-15245DiVA: diva2:181765
Available from: 2008-11-25 Created: 2008-11-25 Last updated: 2011-01-10Bibliographically approved

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Department of Physical, Inorganic and Structural Chemistry

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CiteExportLink to record
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