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Organic Geochemical Microanalysis by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
Stockholm University, Faculty of Science, Department of Geology and Geochemistry.
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2008 (Swedish)In: Geostandards and Geoanalytical Research, Vol. 32, 267-277 p.Article in journal (Refereed) Published
Abstract [sv]

Time-of-flight secondary ion mass spectrometry

(ToF-SIMS) is a powerful method for the chemical

analysis of solid surfaces. In this paper, the

capabilities and limitations of this technique and

the potential for its use in geochemical research are

outlined. Using ToF-SIMS, the chemical composition

of sample structures down to 10–100 μm can be

determined, without the need for pre-selection or

labelling of the analysed substances. In addition,

the lateral distribution of organic and inorganic

compounds can be mapped in geochemical

samples at a resolution in the micrometre range.

The capabilities of the technique in geochemistry

are illustrated by two examples. In the first example,

it is shown that ToF-SIMS can be used to detect

biomarkers in oil samples, making it a promising

method for the analysis of biomarkers in fluid

inclusions. In the second example, a number of

specific lipid biomarkers were identified and

mapped on the surface of a microbial mat

cryosection surface. Post-measurement optical

microscopy correlated the localisation of the lipids

with the presence of methanotrophic archaea in the

microbial mat.

Place, publisher, year, edition, pages
2008. Vol. 32, 267-277 p.
Keyword [en]
ToF-SIMS, biomarkers, oil, microbial mat
URN: urn:nbn:se:su:diva-16180DOI: doi:10.1111/j.1751-908X.2008.00909.xISI: 000259680900003OAI: diva2:182700
Available from: 2008-12-15 Created: 2008-12-15 Last updated: 2011-01-10Bibliographically approved

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ReferencesLink to record
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