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200 and 300 MeV/nucleon reactions responsible for single-event effects in microelectronics
Stockholm University, Faculty of Science, Department of Physics. kärnfysik.
Stockholm University, Faculty of Science, Department of Physics. kärnfysik.
Stockholm University, Faculty of Science, Department of Physics. kärnfysik.
2008 (English)In: Physical Review C, Vol. 77Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2008. Vol. 77
National Category
Subatomic Physics
Identifiers
URN: urn:nbn:se:su:diva-16703OAI: oai:DiVA.org:su-16703DiVA: diva2:183223
Note
Totalt 24 författareAvailable from: 2008-12-22 Created: 2008-12-22 Last updated: 2011-01-10Bibliographically approved

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