First results from the Stockholm Electron Beam Ion Trap
2007 (English)In: Journal of Physics, Conference Series, ISSN 1742-6588, E-ISSN 1742-6596, Vol. 58, no 303, 303-306 p.Article in journal (Refereed) Published
A new laboratory for highly charged ions is being built up at Stockholm university. An electron beam ion trap (EBIT) (3T magnet,≤30 keV electron beam) was installed. It is used for spectroscopic studies, precision mass measurements, electron ion collisions, and highlycharged ion surface studies. Here we report about a fast ion-extraction scheme from ebit and first results using a time-of-flight detection as well as a labview based operational system of ebit.
Place, publisher, year, edition, pages
2007. Vol. 58, no 303, 303-306 p.
IdentifiersURN: urn:nbn:se:su:diva-16988DOI: 10.1088/1742-6596/58/1/067OAI: oai:DiVA.org:su-16988DiVA: diva2:183508