Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Anti-patterns as a Means of Focusing on Critical Quality Aspects in Enterprise Modeling
Stockholm University, Faculty of Social Sciences, Department of Computer and Systems Sciences.
2009 (English)In: Enterprise, Business-Process and Information Systems Modeling, Terry Halpin, John Krogstie, Selmin Nurcan, Erik Proper, Rainer Schmidt, Pnina Soffer, Roland Ukor , 2009Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
Terry Halpin, John Krogstie, Selmin Nurcan, Erik Proper, Rainer Schmidt, Pnina Soffer, Roland Ukor , 2009.
Identifiers
URN: urn:nbn:se:su:diva-33374ISBN: 978-3-642-01861-9 (print)OAI: oai:DiVA.org:su-33374DiVA: diva2:283058
Note
Proceedings of EMMSAD 2009Available from: 2009-12-23 Created: 2009-12-23

Open Access in DiVA

No full text

By organisation
Department of Computer and Systems Sciences

Search outside of DiVA

GoogleGoogle Scholar

isbn
urn-nbn

Altmetric score

isbn
urn-nbn
Total: 28 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf