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High-resolution electron microscopy of a Sr-containing sialon polytypoid phase
Stockholm University, Faculty of Science, Department of Materials and Environmental Chemistry (MMK).
Stockholm University, Faculty of Science, Department of Materials and Environmental Chemistry (MMK).
Stockholm University, Faculty of Science, Department of Materials and Environmental Chemistry (MMK).
Stockholm University, Faculty of Science, Department of Materials and Environmental Chemistry (MMK).
1999 (English)In: Journal of the European Ceramic Society, ISSN 0955-2219, E-ISSN 1873-619X, Vol. 19, 2723-2730 p.Article in journal (Refereed) Published
Abstract [en]

A new type of Sr-containing sialon polytypoid phase with the structural formula SrSi10-xAl18+xN32-xOx (x approximate to l) has been found in the Sr-Si-Al-O-N system. The phase was characterised by X-ray powder diffraction (XRPD), and its structure was investigated by electron diffraction (ED) and high resolution electron microscopy (HREM). It is considerably disordered, but the average structure has a rhombohedral unit cell with a=5.335(5)approximate to root 3.a(AIN) and c= 79.1(1)Angstrom approximate to 30.c(AIN). The Sr atoms ave located in layers M-Sr-M, M=(Si/Al), at the origin of the unit cell with 12 X= (O,N) atoms around it, at distances of similar to 3 Angstrom, forming a cubo-octahedron. The X atoms that form a hexagon around the Sr atom in the ab plane are corner shared by M = (Si/Al) tetrahedra with opposite polarity in adjacent layers in which 2/3 of the tetrahedra are occupied. The M-Sr-M layers alternate with normally eight-layer-thick AIN type blocks, although the thickness of these blocks frequently varies. The structural model obtained from the HREM images includes a polarity reversal of the tetrahedra in the AIN blocks, similar to that proposed to occur in Si-Al-O-N polytypoid phases. The model with one Sr layer and 10 M = (Si,Al) layers per 1/3 of the repeat unit agrees with the composition of the phase and experimental HREM images.

Place, publisher, year, edition, pages
1999. Vol. 19, 2723-2730 p.
Keyword [en]
strontium, sialon, polytypoid, electron microscopy
National Category
Materials Chemistry
Research subject
Inorganic Chemistry
Identifiers
URN: urn:nbn:se:su:diva-43882DOI: 10.1016/S0955-2219(99)00082-5ISI: 000083466200002OAI: oai:DiVA.org:su-43882DiVA: diva2:371571
Available from: 2010-11-21 Created: 2010-10-29 Last updated: 2017-12-12Bibliographically approved

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Grins, JekabEsmaeilzadeh, SaeidSvensson, GunnarShen, Zhijian James
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