Quantitative electron diffraction for crystal structure determination
2009 (English)In: Electron crystallography for materials research and quantitative characterization of nanostructured materials / [ed] P. Moeck, S.Hovmoeller, S. Nicolopoulos, S.rouvimov, V.Petkov,M.Gateshki, P.Fraundorf, 2009, GG01-04 p.Conference paper (Refereed)
We present a quantitative investigation of data quality using electron precession, compared to standard selected-area electron diffraction (SAED). Data can be collected on a CCD camera and automatically extracted by computer. The critical question of data quality is addressed – can electron diffraction data compete with X-ray diffraction data in terms of resolution, completeness and quality of intensities?
Place, publisher, year, edition, pages
2009. GG01-04 p.
Research subject Inorganic Chemistry
IdentifiersURN: urn:nbn:se:su:diva-50709OAI: oai:DiVA.org:su-50709DiVA: diva2:382290