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Evaluating quartz crystallographic preferred orientations and the role of deformation partitioning using EBSD and fabric analyser techniques
Stockholm University, Faculty of Science, Department of Geological Sciences.
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2010 (English)In: Journal of Structural Geology, ISSN 0191-8141, Vol. 32, no 6, 803-817 p.Article in journal (Refereed) Published
Abstract [en]

Quartz crystallographic preferred orientations (CPO) from three distinct orthogneisses using both the Electron Back Scatter Diffraction (EBSD) and Fabric Analyser (FA) techniques reveal a clear trend from basal < a > and rhomb < a + c > slip for high P-T conditions (670 +/- 20 degrees C/9 kbar), rhomb < a + c > and basal < a > slip for medium P-T (590 +/- 15 degrees C/6 kbar) and a dominance of prism < a > slip for lower P T conditions (<570 degrees C/4-5 kbar). The textural variations are interpreted in terms of a temperature field gradient and microscale strain partitioning controlled by a weak feldspar matrix that can locally invert the expected slip system sequences. Locally quartz CPUs are different within one thin section, and in comparison to bulk orientation measurements both, EBSD and the Fabric Analyser techniques are ideal to determine such textural heterogeneities. While the EBSD is a powerful technique to determine the full CPO, measurements from similar locations inside several quartz grains from the orthogneisses and an annealed and undeformed quartzite show that the FA is an accurate tool to determine CPUs of c-axis orientations in uniaxial materials. In a CPO focussed study the FA is a cheap alternative to EBSD as the analysis of whole thin section can be accomplished in a very short time, with minimal sample preparation. With the FA it is possible to evaluate the CPUs of several samples quickly with an accuracy that allows identification of the main slip systems and their homogeneity.

Place, publisher, year, edition, pages
2010. Vol. 32, no 6, 803-817 p.
Keyword [en]
Crystallographic preferred orientation, Deformation partitioning, Electron back-scattered diffraction, Fabric analyser, Quartz, Thaya dome
National Category
Natural Sciences
URN: urn:nbn:se:su:diva-51676DOI: 10.1016/j.jsg.2010.05.007ISI: 000282862600009OAI: diva2:385826
authorCount :5Available from: 2011-01-12 Created: 2011-01-12 Last updated: 2011-01-12Bibliographically approved

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Piazolo, Sandra
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