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Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy
Stockholm University, Faculty of Science, Department of Materials and Environmental Chemistry (MMK), Inorganic and Structural Chemistry.
Stockholm University, Faculty of Science, Department of Materials and Environmental Chemistry (MMK), Inorganic and Structural Chemistry.
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2008 (English)In: Chemical Communications, ISSN 1359-7345, E-ISSN 1364-548X, no 33, 3894-3896 p.Article in journal (Refereed) Published
Abstract [en]

The resolving power of high-resolution scanning electron microscopy was judged using topographical height data from atomic force microscopy in order to assess the technique as a tool for understanding nanoporous crystal growth.

Place, publisher, year, edition, pages
2008. no 33, 3894-3896 p.
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Inorganic Chemistry
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URN: urn:nbn:se:su:diva-68457DOI: 10.1039/b804440fOAI: oai:DiVA.org:su-68457DiVA: diva2:472348
Available from: 2012-01-03 Created: 2012-01-03 Last updated: 2017-12-08Bibliographically approved

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