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Mass fluxes and isofluxes of methane (ch4) at a new hampshire fen measured by a continuous wave quantum cascade laser spectrometer
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2012 (English)In: Journal of Geophysical Research, ISSN 0148-0227, E-ISSN 2156-2202, Vol. 117, D10301- p.Article in journal (Refereed) Published
Abstract [en]

We have developed a mid-infrared continuous-wave quantum cascade laser direct-absorption spectrometer (QCLS) capable of high frequency (>= 1 Hz) measurements of (CH4)-C-12 and (CH4)-C-13 isotopologues of methane (CH4) with in situ 1-s RMS delta C-13(CH4) precision of 1.5 parts per thousand and Allan-minimum precision of 0.2 parts per thousand. We deployed this QCLS in a well-studied New Hampshire fen to compare measurements of CH4 isoflux by eddy covariance (EC) to Keeling regressions of data from automated flux chamber sampling. Mean CH4 fluxes of 6.5 +/- 0.7 mg CH4 m(-2) hr(-1) over two days of EC sampling in July, 2009 were indistinguishable from mean autochamber CH4 fluxes (6.6 +/- 0.8 mgCH(4) m(-2) hr(-1)) over the same period. Mean delta C-13(CH4) composition of emitted CH4 calculated using EC isoflux methods was -71 +/- 8 parts per thousand (95% C.I.) while Keeling regressions of 332 chamber closing events over 8 days yielded a corresponding value of -64.5 +/- 0.8 parts per thousand Ebullitive fluxes, representing similar to 10% of total CH4 fluxes at this site, were on average 1.2 parts per thousand enriched in C-13 compared to diffusive fluxes. CH4 isoflux time series have the potential to improve process-based understanding of methanogenesis, fully characterize source isotopic distributions, and serve as additional constraints for both regional and global CH4 modeling analysis.

Place, publisher, year, edition, pages
2012. Vol. 117, D10301- p.
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Meteorology and Atmospheric Sciences
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URN: urn:nbn:se:su:diva-79756DOI: 10.1029/2011JD016960ISI: 000304260300002OAI: oai:DiVA.org:su-79756DiVA: diva2:551995
Note

AuthorCount:9;

Available from: 2012-09-12 Created: 2012-09-11 Last updated: 2017-12-07Bibliographically approved

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Crill, Patrick M.
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