The Determination of Rotation Axis in the Rotation Electron Diffraction Technique
2013 (English)In: Microscopy and Microanalysis, ISSN 1431-9276, E-ISSN 1435-8115, Vol. 19, no 5, 1276-1280 p.Article in journal (Refereed) Published
Methods to determine the rotation axis using the rotation electron diffraction technique are described. A combination of rotation axis tilt, beam tilt, and simulated experimental diffraction patterns with nonintegers zone axis has been used. Accurate knowledge of the crystallographic direction of the incident beam for deducing the excitation error of reflections simultaneously near Bragg positions is essential in quantitative electron diffraction. Experimental patterns from CoP3 are used as examples.
Place, publisher, year, edition, pages
2013. Vol. 19, no 5, 1276-1280 p.
electron diffraction, rotation axis, nonintegers zone axis, rotation electron diffraction technique
IdentifiersURN: urn:nbn:se:su:diva-95077DOI: 10.1017/S1431927613012749ISI: 000324550900020OAI: oai:DiVA.org:su-95077DiVA: diva2:658700