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Structural study of disordered SiC nanowires by three-dimensional rotation electron diffraction
Stockholm University, Faculty of Science, Department of Materials and Environmental Chemistry (MMK).
Stockholm University, Faculty of Science, Department of Materials and Environmental Chemistry (MMK).
Stockholm University, Faculty of Science, Department of Materials and Environmental Chemistry (MMK).
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2014 (English)In: Materials Research Express, ISSN 2053-1591, Vol. 1, no 4, 045023Article in journal (Refereed) Published
Abstract [en]

The structure of disordered SiC nanowires was studied by using the three-dimensional rotation electron diffraction (RED) technique. The streaks shown in the RED images indicated the stacking faults of the nanowire. High-resolution transmission electron microscopy imaging was employed to support the results from the RED data. It suggested that a 2H polytype is most possible for the nanowires.

Place, publisher, year, edition, pages
2014. Vol. 1, no 4, 045023
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Chemical Sciences
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URN: urn:nbn:se:su:diva-109838DOI: 10.1088/2053-1591/1/4/045023OAI: oai:DiVA.org:su-109838DiVA: diva2:767415
Available from: 2014-12-01 Created: 2014-12-01 Last updated: 2017-11-22Bibliographically approved

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Li, DuanGuo, PengWan, WeiZou, JiShen, Zhijian
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