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Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip-surface interactions
Stockholm University, Nordic Institute for Theoretical Physics (Nordita). KTH Royal Institute of Technology, Sweden; Los Alamos National Laboratory, USA.
2014 (English)In: Beilstein Journal of Nanotechnology, ISSN 2190-4286, Vol. 5, 1899-1904 p.Article in journal (Refereed) Published
Abstract [en]

We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever inverse responsivity) of a cantilever. The method is based on the tip-surface force reconstruction technique and does not require any prior knowledge of the eigenmode shape or the particular form of the tip-surface interaction. The calibration method proposed requires a single-point force measurement by using a multimodal drive and its accuracy is independent of the unknown physical amplitude of a higher eigenmode.

Place, publisher, year, edition, pages
2014. Vol. 5, 1899-1904 p.
Keyword [en]
atomic force microscopy, calibration, multimodal AFM, multifrequency AFM
National Category
Nano Technology Physical Sciences
URN: urn:nbn:se:su:diva-110188DOI: 10.3762/bjnano.5.200ISI: 000344193400001OAI: diva2:787538


Available from: 2015-02-10 Created: 2014-12-08 Last updated: 2015-02-10Bibliographically approved

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