Number of Authors: 3
2014 (English)In: Structure from Diffraction Methods / [ed] Duncan W. Bruce, Dermot O'Hare, Richard I. Walton, Chichester: John Wiley & Sons, 2014, 201-258 p.Chapter in book (Refereed)
A transmission electron microscope (TEM) can provide an electron diffraction pattern on the back focal plane of the objective lens and can supply real-space information through images on the image plane. X-ray crystallography, using X-ray diffraction (XRD) with either a powder or a single-crystal diffractometer, is the most precise and most popular method of structural analysis. However, structure determination by powder XRD has its limitations. Due to this, electron crystallography (EC), which is the focus of this chapter, is the only possible technique by which to solve/characterise the crystal structure. The chapter discusses the relationship between crystal structure and TEM images. It describes in detail, the various materials including 1D atomistic crystal, solved by EC methods. The chapter also discusses other TEM techniques such as high-angle annular dark-field imaging (HAADF) and electron tomography.
Place, publisher, year, edition, pages
Chichester: John Wiley & Sons, 2014. 201-258 p.
, Inorganic Materials Series
IdentifiersURN: urn:nbn:se:su:diva-123306DOI: 10.1002/9781118695708.ch4ISI: 000361741700006ISBN: 978-1-118-69570-8ISBN: 978-1-119-95322-7OAI: oai:DiVA.org:su-123306DiVA: diva2:873487