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Ultrafast Molecular Three-Electron Auger Decay
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Number of Authors: 9
2016 (English)In: Physical Review Letters, ISSN 0031-9007, E-ISSN 1079-7114, Vol. 116, no 7, 073001Article in journal (Refereed) Published
Abstract [en]

Three-electron Auger decay is an exotic and elusive process, in which two outer-shell electrons simultaneously refill an inner-shell double vacancy with emission of a single Auger electron. Such transitions are forbidden by the many-electron selection rules, normally making their decay lifetimes orders of magnitude longer than the few-femtosecond lifetimes of normal (two-electron) Auger decay. Here we present theoretical predictions and direct experimental evidence for a few-femtosecond three-electron Auger decay of a double inner-valence-hole state in CH3F. Our analysis shows that in contrast to double core holes, double inner-valence vacancies in molecules can decay exclusively by this ultrafast threeelectron Auger process, and we predict that this phenomenon occurs widely.

Place, publisher, year, edition, pages
2016. Vol. 116, no 7, 073001
National Category
Physical Sciences
URN: urn:nbn:se:su:diva-128174DOI: 10.1103/PhysRevLett.116.073001ISI: 000370622000004OAI: diva2:915073
Available from: 2016-03-29 Created: 2016-03-21 Last updated: 2016-03-29Bibliographically approved

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Linusson, Per
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