Endre søk
RefereraExporteraLink to record
Permanent link

Direct link
Referera
Referensformat
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Annet format
Fler format
Språk
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Annet språk
Fler språk
Utmatningsformat
  • html
  • text
  • asciidoc
  • rtf
Noise-dependent bias in quantitative STEM-EMCD experiments revealed by bootstrapping
Stockholms universitet, Naturvetenskapliga fakulteten, Institutionen för material- och miljökemi (MMK). Uppsala University, Sweden; Forschungszentrum Jülich, Germany.ORCID-id: 0000-0002-8262-5893
Vise andre og tillknytning
Rekke forfattare: 72024 (engelsk)Inngår i: Ultramicroscopy, ISSN 0304-3991, E-ISSN 1879-2723, Vol. 257, artikkel-id 113891Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

Electron magnetic circular dichroism (EMCD) is a powerful technique for estimating element-specific magnetic moments of materials on nanoscale with the potential to reach atomic resolution in transmission electron microscopes. However, the fundamentally weak EMCD signal strength complicates quantification of magnetic moments, as this requires very high precision, especially in the denominator of the sum rules. Here, we employ a statistical resampling technique known as bootstrapping to an experimental EMCD dataset to produce an empirical estimate of the noise-dependent error distribution resulting from application of EMCD sum rules to bcc iron in a 3-beam orientation. We observe clear experimental evidence that noisy EMCD signals preferentially bias the estimation of magnetic moments, further supporting this with error distributions produced by Monte-Carlo simulations. Finally, we propose guidelines for the recognition and minimization of this bias in the estimation of magnetic moments.

sted, utgiver, år, opplag, sider
2024. Vol. 257, artikkel-id 113891
Emneord [en]
Electron magnetic circular dichroism, Electron energy loss spectroscopy, Scanning, Transmission electron microscopy, Bootstrapping, Noise dependent bias, Error analysis
HSV kategori
Identifikatorer
URN: urn:nbn:se:su:diva-225757DOI: 10.1016/j.ultramic.2023.113891ISI: 001132754500001PubMedID: 38043363Scopus ID: 2-s2.0-85178597506OAI: oai:DiVA.org:su-225757DiVA, id: diva2:1830457
Tilgjengelig fra: 2024-01-23 Laget: 2024-01-23 Sist oppdatert: 2024-01-30bibliografisk kontrollert

Open Access i DiVA

Fulltekst mangler i DiVA

Andre lenker

Forlagets fulltekstPubMedScopus

Person

Ali, HasanTai, Cheuk-WaiThersleff, Thomas

Søk i DiVA

Av forfatter/redaktør
Ali, HasanTai, Cheuk-WaiThersleff, Thomas
Av organisasjonen
I samme tidsskrift
Ultramicroscopy

Søk utenfor DiVA

GoogleGoogle Scholar

doi
pubmed
urn-nbn

Altmetric

doi
pubmed
urn-nbn
Totalt: 83 treff
RefereraExporteraLink to record
Permanent link

Direct link
Referera
Referensformat
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Annet format
Fler format
Språk
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Annet språk
Fler språk
Utmatningsformat
  • html
  • text
  • asciidoc
  • rtf